| 标题 |
Vacuum null-point scanning thermal microscopy: Simultaneous quantitative nanoscale mapping of undisturbed temperature and thermal resistance |
| 网址 | |
| DOI | |
| 其它 |
期刊:International Journal of Thermal Sciences 作者:Juhang Cha; Hwijong Shin; Ohmyoung Kwon 出版日期:2022 |
| 求助人 | |
| 下载 |
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(2025-6-4)