| 标题 |
Temporal Fusion Transformer-Based Remaining Useful Lifetime Prediction of IGBTs Under Non-Constant Stress Bond wire Degradation |
| 网址 | |
| DOI | |
| 其它 |
期刊:IEEE Transactions on Power Electronics 作者:Xiaofeng Jiang; Tao Fan; Zhijie Qiu; Guolin He; Dan Zheng; et al 出版日期:2026-01-01 |
| 求助人 | |
| 下载 |
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(2025-6-4)