| 标题 |
A Correlative Study of Silicon Carbide Power Devices Using Atom Probe Tomography and Transmission Electron Microscopy |
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| 其它 |
期刊:ISTFA 2023: Conference Proceedings from the 49th International Symposium for Testing and Failure Analysis 作者:Ramya Cuduvally; Bavley Guerguis; Brian Langelier; Nabil D. Bassim; Ramya Cuduvally; et al 出版日期:2023 |
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(2025-6-4)