| 标题 |
Fe-Related Trapping and Detrapping Dynamics in AlGaN/GaN HEMTs Inspected by Drain Current Transient (DCT) Spectroscopy |
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| 其它 |
期刊:IEEE Transactions on Device and Materials Reliability 作者:Vaidehi Vijay Painter; Raphael Sommet; Christophe Chang; Valeria Di Giacomo Brunel; Florent Gaillard; et al 出版日期:2025 |
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(2025-6-4)