| 标题 |
Measurement of liquid films thickness in a condensing and re-evaporating environment using attenuation of near infrared light |
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| DOI | |
| 其它 |
期刊:Nuclear Engineering and Design 作者:Guillaume Mignot; Julien Dupont; Sidharth Paranjape; Hakim Ouldrebai; Wilhelm-Martin Bissels; et al 出版日期:2017-07-15 |
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(2025-6-4)