| 标题 |
A study on the improvement of machine learning (ML)-based defect prediction model reflecting process variations |
| 网址 | |
| DOI |
10.1117/12.3050361
doi
|
| 其它 |
期刊:DTCO and Computational Patterning IV 作者:Seungsu Yoon; Namjae Kim; Woojin Han; Munsu Shin; Juyoung Choi; et al 出版日期:2025-04-22 |
| 求助人 | |
| 下载 | 求助已完成,仅限求助人下载。 |
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(2025-6-4)