| 标题 |
Application of the Theory of Critical Distances to predict the effect of induced and process inherent defects for SLM Ti-6Al-4V in high cycle fatigue |
| 网址 | |
| DOI | |
| 其它 |
期刊:CIRP Annals 作者:Bobby Gillham; Andrey Yankin; Fionnan McNamara; Charles Tomonto; David Taylor; et al 出版日期:2021-01-01 |
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(2025-6-4)