| 标题 |
New Insights into the Transient Behavior of IGZO 2T0C DRAM: Capacitive Coupling, Carrier Injection and De-trapping |
| 网址 | |
| DOI | |
| 其它 |
期刊:2026 10th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) 作者:Wenjie Zhao; Yecheng Yang; Qianlan Hu; Yuzhe Zhu; Honggang Liu; et al 出版日期:2026-05-07 |
| 求助人 | |
| 下载 |
PDF的下载单位、IP信息已删除
(2025-6-4)