| 标题 |
Bulk stacking fault probability as a diffraction-derived metric for quantitative planar defect kinetics |
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| DOI | |
| 其它 |
期刊:Journal of Materials Science & Technology 作者:Hongwei Gao; Runguang Li; Yiyi Feng; Youkang Wang; Shilei Li; et al 出版日期:2026-08-27 |
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(2025-6-4)