| 标题 |
Quantitative and nondestructive determination of residual stress for SiO 2 thin film by laser-generated surface acoustic wave technique |
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| DOI | |
| 其它 |
期刊:Measurement Science and Technology 作者:Li Zhang; Xia Xiao; Haiyang Qi; Yiting Huang; Huiquan Qin 出版日期:2022-01-07 |
| 求助人 | |
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(2025-6-4)