| 标题 |
Identification of damage and fracture modes in power electronic packaging from experimental micro-shear tests and finite element modeling |
| 网址 | |
| DOI | |
| 其它 |
期刊:Engineering Fracture Mechanics 作者:S. Msolli; A. Baazaoui; J. Alexis; H.S. Kim 出版日期:2018-02-01 |
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(2025-6-4)