| 标题 |
Comprehensive Strategies for Imprint Recovery in Hafnia-Based Ferroelectric Capacitors and Mechanism Clarification: Experiment and Modeling |
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| DOI | |
| 其它 |
期刊:2026 IEEE International Reliability Physics Symposium (IRPS) 作者:Guan Feng; Yu Li; Hao Jiang; Xiaodong Wang; Shucheng Zhang; et al 出版日期:2026-03-22 |
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(2025-6-4)