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Investigation of Time-Dependent Dielectric Breakdown on Commercial SiC MOSFETs Using Constant-Voltage and Pulse-Voltage |
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期刊:IEEE Transactions on Electron Devices 作者:Michael Jin; Hengyu Yu; Monikuntala Bhattacharya; Jiashu Qian; Shiva Houshmand; et al 出版日期:2025-08-09 |
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(2025-6-4)