| 标题 |
Highly reliable micro-scale Cu sintered joint by oxidation-reduction bonding process under thermal cycling |
| 网址 | |
| DOI | |
| 其它 |
期刊:Microelectronics Reliability 作者:Min-Su Kim; Dongjin Kim; Myong-Hoon Roh; Hiroshi Nishikawa 出版日期:2023-11-01 |
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(2025-6-4)