| 标题 |
Attention-Enhanced YOLOv8-Seg with WGAN-GP-Based Generative Data Augmentation for High-Precision Surface Defect Detection on Coarsely Ground SiC Wafers |
| 网址 | |
| DOI |
10.32604/cmc.2026.075398
doi
|
| 其它 |
期刊:Computers, Materials & Continua 作者:Chih-Yung Huang; Hong-Ru Shi; Min Xie 出版日期:2026-01-01 |
| 求助人 | |
| 下载 | 求助已完成,仅限求助人下载。 |
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(2025-6-4)