材料科学
氮化硼
辐照
陶瓷
氮化物
中子
电离辐射
硼
带隙
光电子学
宽禁带半导体
放射化学
纳米技术
复合材料
核物理学
化学
物理
图层(电子)
作者
Zhiyuan Chen,Yujie Yang,Fang Yao,Yang Yong-fu,Yuwei Li,Xuchao Jia,Junqi Dong,Libing Qian,Wanping Chen,Wusheng Zou,Jiangbin Zhao,Jinbiao Pang,Wen Xu,Zhu Wang,Gaokui He,Qianqian Lin
标识
DOI:10.1021/acsami.3c05953
摘要
X-ray detectors based on conventional semiconductors with large atomic numbers are suffering from the poor stability under a high dose rate of ionizing irradiation. In this work, we demonstrate that a wide band gap ceramic-boron nitride with small atomic numbers could be used for sensitive X-ray detection. Boron nitride samples showed excellent resistance to ionizing radiation, which have been systematically studied with the neutron- and electron-aging experiments. Then, we fully analyzed the influence of these aging effects on the fundamental properties of boron nitride. Interestingly, we found that the boron nitride samples could maintain relatively good charge transport properties even after large dose of neutron irradiation. The fabricated X-ray detectors showed decent performance metrics, and the neutron-aged boron nitride even showed improved operational stability under continuous X-ray irradiation, suggesting the great potential for real applications.
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