降级(电信)
催化作用
电化学
化学
Atom(片上系统)
纳米技术
材料科学
化学工程
电极
物理化学
电信
生物化学
计算机科学
工程类
嵌入式系统
作者
Geunsu Bae,Sunghoon Han,Hyung‐Suk Oh,Chang Hyuck Choi
标识
DOI:10.1002/anie.202219227
摘要
Abstract Single‐atom catalysts (SACs) are appealing next‐generation catalysts for various electrochemical technologies. Along with significant breakthroughs in their initial activity, SACs now face the next challenge for their viable applications, insufficient operational stability. In this Minireview, we summarize the current knowledge of SAC degradation mechanisms mainly based on Fe−N−C SACs, some of the most investigated SACs. Recent studies on isolated metal, ligand, and support degradations are introduced, and the underlying fundamentals of each degradation path are categorized into active site density (SD) and turnover frequency (TOF) losses. Finally, we discuss the challenges and prospects for the future outlook of stable SACs.
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