还原(数学)
光电子学
材料科学
电荷(物理)
电气工程
电子工程
物理
工程类
几何学
数学
量子力学
作者
Tomohiro Tamaki,Atsufumi Inoue,Shiro Hino,Kazuyasu Nishikawa,Makoto Hashimoto,Mitsuhisa Kawase,Yohei Sudo,Tsutomu Ogawa,Tatsuro Watahiki
标识
DOI:10.23919/ispsd62843.2025.11117516
摘要
This study investigates the switching loss reduction mechanisms in 1.2 kV-class Tapered and protruded pillar Super Junction Insulated Gate Bipolar Transistors (T-SJ IGBTs). Experimental results at 150°C demonstrate a 61.8% reduction in turn-off energy loss $\left(E_{\text{off}}\right)$ by increasing $\mathrm{d} V_{\text{CE}} / \mathrm{d} t$ from $5.8 \text{kV} / \mu \mathrm{s}$ to 18.9 $\text{kV} / \mu \mathrm{s}$, and a 12.9% reduction in turn-on energy loss $(E_{\mathrm{o}\mathrm{n}})$ under identical dIC/dt condition. The reduction in switching loss is closely linked to the optimization of doping concentrations in the p- and n-pillars, with the net charge gradient playing a key role. The net charge can be expressed as a deviation from the ideal vertical SJ (VSJ) structure, and its gradient strongly influences d $V_{\text{CE}} / \mathrm{d} t$ and $E_{\mathrm{o}\text{ff}}$.
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