结构精修
强度(物理)
矿物学
样品制备
相(物质)
定量分析(化学)
样品(材料)
材料科学
分析化学(期刊)
地质学
化学
结晶学
晶体结构
色谱法
光学
物理
有机化学
出处
期刊:Clay Minerals
[The Mineralogical Society]
日期:2000-03-01
卷期号:35 (1): 291-302
被引量:307
标识
DOI:10.1180/000985500546666
摘要
Abstract X-ray diffraction is used widely for quantitative analysis of geological samples but studies which document the accuracy of the methods employed are not numerous. Synthetic sandstones of known composition are used to compare a ‘routine application’ of a Rietveld and a reference intensity ratio (RIR) method of quantitative phase analysis. Both methods give similar results accurate to within ~±3 wt.% at the 95% confidence level. The high degree of accuracy obtained is believed to depend to a large extent on the spray-drying method of sample preparation used to eliminate preferred orientation.
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