X-ray diffraction at elevated temperatures: a method for in situ process analysis
出处
期刊:Choice Reviews Online [Association of College and Research Libraries] 日期:1994-03-01卷期号:31 (07): 31-3838被引量:33
标识
DOI:10.5860/choice.31-3838
摘要
Review of X-ray diffraction X-ray diffraction at elevated temperatures using intense X-ray sources X-ray diffraction at elevated temperatures using position-sensitive detectors instrumentation of X-ray diffraction at elevated temperatures in situ process analysis at elevated temperatures applications of X-ray diffraction at elevated temperatures kinetic study using X-ray diffraction at elevated temperatures.