单片微波集成电路
插入损耗
氮化镓
回波损耗
材料科学
宽带
晶体管
光电子学
电气工程
高电子迁移率晶体管
拓扑(电路)
分流(医疗)
功率增益
计算机科学
工程类
电信
放大器
医学
心脏病学
CMOS芯片
复合材料
天线(收音机)
电压
图层(电子)
作者
Volkan Ertürk,Armagan Gurdal,Ekmel Özbay
出处
期刊:
[Institute of Electrical and Electronics Engineers]
日期:2023-05-22
卷期号:33 (8): 1207-1210
被引量:8
标识
DOI:10.1109/lmwt.2023.3275105
摘要
A high-power, broadband monolithic microwave integrated circuit (MMIC) single-pole double-throw (SPDT) switch is designed with gate-optimized high-electron-mobility transistors (HEMTs) using AlGaN/Gallium nitride (GaN) technology. The foot length of the gate is varied from 200 to 250 nm, and the head length is varied from 500 to 750 nm in the T-gate structure to optimize the radio frequency (RF) performance. The SPDT switch is designed in a series–shunt–shunt topology using gate topology as a design parameter. The switch has achieved an insertion loss better than 0.75 dB throughout the 3.5–13.5-GHz bandwidth. It can transmit 30-W output power at 0.1-dB compression point and handle 47.5-dBm input power at ${P}_{\text {1 dB}}$ . The isolation is above 25 dB, and the return loss is better than 11 dB. With its low insertion and high power-handling capacity in broadband, the SPDT switch shows state-of-the-art performance for high-power communication systems and radar applications.
科研通智能强力驱动
Strongly Powered by AbleSci AI