随机数生成
记忆电阻器
发电机(电路理论)
吞吐量
计算机科学
数学
算法
电气工程
物理
工程类
电信
量子力学
功率(物理)
无线
作者
Yuyang Fu,Jinyu Wen,Lun Wang,Ling Yang,Qihang Zhu,Wenbin Zuo,Puyi Zhang,Yi Li,Hao Tong,Guokun Ma,Hao Wang,Xiangshui Miao
标识
DOI:10.1109/led.2023.3259000
摘要
True random number generators (TRNGs) based on threshold switching memristors emerge as a building block for secure electronics. However, the throughputs reported in previous studies have a stark gap with the requirements of practical applications ( $>$ 1 Mb/s). Here, we implement a high-speed TRNG with a GeTex ovonic threshold switching (OTS) memristor. The TRNG throughput reaches 2.22 Mb/s for a single cell, which is 2.2 times faster than the prior state-of-the-art threshold-switching-based TRNG. In addition, the TRNG endurance of ${2}\times {10} ^{{9}}$ bits was achieved, and the random bits passed 12 tests in the National Institute of Standards and Technology statistical test suite. Our results demonstrated that the OTS-based TRNG could provide a high–throughput and highly secure solution for edge applications.
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