微控制器
修边
感测放大器
嵌入式系统
可靠性(半导体)
物理不可克隆功能
计算机科学
宏
电压
电子工程
工程类
计算机硬件
控制器(灌溉)
可靠性工程
电气工程
放大器
错误检测和纠正
认证(法律)
加密
解码方法
过程(计算)
功率(物理)
数据完整性
集成电路
计算机数据存储
电路可靠性
维修工程
软件
逻辑门
转换器
磁阻随机存取存储器
过程控制
物联网
作者
Jiongzhe Su,Haoran Du,M.-K. Chen,Keyang Zhang,Yichen Zhu,Quanhai Zhu,Bo Liu,Hao Cai
标识
DOI:10.1109/tr.2025.3627184
摘要
Recently, one-time-programmable (OTP) memory has been widely used in micro controller unit (MCU) due to its storage reliability and tamper-proof. Based on the analysis of the breakdown mechanism of magnetic tunnel junction and the measurement results used for modeling, this article demonstrates a 96-Kb versatile MRAM-OTP macro integrated with a 6-Kb OTP-based physical unclonable function (PUF) in 55-nm fully depleted silicon on insulator process. The MRAM-OTP macro realize minimum 3.0 V program voltage and 100 ns for 32-bit program speed. The on-chip power supply method trims with PVT variations and completes voltage switching between two modes. The multi-bit programming design saves about 97% time and 5% energy using self-termination. The discernible dual-mode sense amplifier saves 57.4% power in OTP reading with no lacks of sensing yield. We also presented the application scheme of the proposed MRAM-OTP macro within the trimming information storage and security MCU design, with the PUF helped to complete the authentication process together with OTP and the error correcting code assisted encrypting and correcting process. The trimming information can help to enhance the reliability of STT-MRAM main area. With the reconfigurable bit-cell design, the Inter-HD and Intra-HD of the OTP-based PUF can reach 49.77% and 0.08%, respectively.
科研通智能强力驱动
Strongly Powered by AbleSci AI