X射线光电子能谱
谱线
口译(哲学)
氮气
化学
分辨率(逻辑)
碳纤维
分析化学(期刊)
材料科学
计算机科学
物理
环境化学
核磁共振
人工智能
天文
复合数
程序设计语言
有机化学
复合材料
出处
期刊:Journal of vacuum science & technology
[American Institute of Physics]
日期:2020-03-16
卷期号:38 (3)
被引量:213
摘要
This perspective explores the complexity of nitrogen chemistry and its interpretation from high-resolution x-ray photoelectron spectra by examining metal-nitrogen-doped carbon systems used in many technological applications. Current understanding of factors contributing to nitrogen 1s photoelectron spectroscopic signature is reviewed, and limitations on assigning precise chemistries to individual spectral ranges are discussed. The importance of proper curve fitting of XPS spectra based on appropriate peak widths and shapes for correct data interpretation is highlighted. Appropriate peak fitting and chemical identification are critical to developing structure-to-property correlations for functional materials in which nitrogen chemistry plays a vital role.
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