Modeling of high voltage 4H-SiC JFETs and MOSFETs for power electronics applications
作者
Yi Wang,Callaway J. Cass,Ke Tang,Harsh Naik,T. Paul Chow,Dushan Boroyevich,Fred Wang
出处
期刊:PESC record日期:2008-06-01卷期号:: 4758-4761被引量:9
标识
DOI:10.1109/pesc.2008.4592722
摘要
Silicon Carbide (SiC), with its high critical electric field property and the capability of operation at high temperature, has attracted much attention and shown to be a promising semiconductor material for high power devices. Some of the most widely used devices in power circuits are the JFETs and the MOSFETs. Based on characterization of high voltage 4H-SiC JFET and MOSFET, this work compares the using of these two kinds of devices in power systems from both electrical and thermal points of view and compact models are developed for circuit simulations.