动力学
铁电性
材料科学
薄膜
瞬态(计算机编程)
凝聚态物理
热力学
光电子学
纳米技术
电介质
计算机科学
物理
量子力学
操作系统
作者
Klaus Dimmler,Michael D. Parris,Donald P. Butler,Shane M. Eaton,B. Pouligny,J. F. Scott,Yoshihiro Ishibashi
摘要
The time dependence of the current transient i(t) produced by the reversal of domains in ferroelectric potassium nitrate thin-film memories of 75–300 nm is analyzed as a function of temperature and of thickness using the Avrami theory. For all the films the kinetics confirm the low-dimensional nature of the system
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