悬臂梁
非接触原子力显微镜
材料科学
干涉测量
光学
光纤
开尔文探针力显微镜
执行机构
偏转(物理)
光学力
云母
触针
静电力显微镜
光电子学
光纤传感器
物理
原子力显微镜
声学
纳米技术
复合材料
光学镊子
电气工程
工程类
作者
Nobuhiro Kato,Ippei Suzuki,Hisao Kikuta,Koichi Iwata
摘要
A microforce sensor with a force feedback method for scanning force microscopy is presented. The force sensor is constructed by using an optical fiber and a microcantilever. The facet of the optical fiber is coated with a gold thin film 15 Å thick. This gold film acts not only as a partially reflected mirror but also as an electrode of the electrostatic actuator. The interaction force between a probe tip and a sample is balanced by the electrostatic force. The deflection of the cantilever is measured by an interferometer consisting of the facet of the optical fiber and the cantilever surface. We have made the force sensor and measured some force curves of a mica surface with a SiN probe tip. The force curves obtained by this sensor are quite different from the curves by a conventional measurement without a feedback system. The force resolution of the system is 10−10 N with a bandwidth of dc∼1 kHz.
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