氧化剂
臭氧
材料科学
过氧化氢
微电子
硅
蚀刻(微加工)
光伏系统
共发射极
化学工程
纳米技术
光电子学
化学
电气工程
有机化学
图层(电子)
工程类
作者
Anamaria Moldovan,K. Birmann,J. Rentsch,Martin Zimmer,Thomas Gitte,Jens Fittkau
标识
DOI:10.4028/www.scientific.net/ssp.195.305
摘要
RCA cleaning in multiple variations is widely used in photovoltaic production lines for high efficiency solar cells. These commonly peroxide based cleaning procedures are effective, but suffering from large chemical consumption and waste generation. A substitution of hydrogen peroxide by ozone in cleaning solutions is not realized yet for PV devices despite its high oxidation potential and facility advantages. The very high potential of ozone cleaning has been shown in various microelectronic applications [1-7]. Dissolved ozone in HF/HCl solution gives the option of cleaning by combined silicon etching and oxidizing as well as complexing metal contaminations due to F - and Cl - .
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