纳米
颗粒(地质)
原子力显微镜
星团(航天器)
淀粉
材料科学
纳米技术
纳米尺度
化学工程
化学物理
结晶学
化学
复合材料
有机化学
计算机科学
工程类
程序设计语言
作者
T. Ohtani,T. Yoshino,Tatsuo Ushiki,S. Hagiwara,Takaaki Maekawa
出处
期刊:Journal of Electron Microscopy
[Oxford University Press]
日期:2000-01-01
卷期号:49 (3): 487-489
被引量:29
标识
DOI:10.1093/oxfordjournals.jmicro.a023833
摘要
Atomic force microscopy (AFM) was performed for the analysis of the fine structure of rice starch granules in the nanometre scale which were prepared by a physical destruction method. The present study directly demonstrated that fine particles of approximately 30 nm in diameter were present inside each granule and occasionally formed straight chain arrangements. We considered that these fine particles correspond to the individual single cluster in the cluster model which has been proposed in previous studies on the starch granule structure.
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