Impurity levels in the layered semiconductor p‐GaSe doped with group V elements As, Bi and Sb

Abstract The radiative and non radiative recombination mechanisms in the As, Sb and Bi‐doped GaSe have been investigated on the basis of photoluminescence (PL) and Hall effect measurements. The PL features (at 77 K) related to the impurity levels coming from the As, Sb and Bi atoms are dominated by a broad emission band at about 1.7 eV. From the temperature dependences of the peak energy and PL intensity and the dependence of excitation intensity of peak energy, it was found that the 1.7 eV emission band is due to the transition from the shallow donor level at about 0.08 eV below the conduction band to the deep acceptor. In addition it was found, from the temperature dependence of hole concentration, that a deep acceptor level at about 0.6 eV above the valence band is formed by the doping atoms. It is associated with defects or defect complexes. (© 2005 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)