雪崩光电二极管
APDS
锗
光电子学
硅光子学
灵敏度(控制系统)
光电二极管
材料科学
光子学
硅
多模光纤
可靠性(半导体)
光纤
光学
电子工程
物理
工程类
探测器
量子力学
功率(物理)
作者
Mengyuan Huang,Li Su,Pengfei Cai,Guanghui Hou,Tzung-I Su,Wang Chen,Ching-yin Hong,Dong Pan
标识
DOI:10.1109/jstqe.2017.2749958
摘要
Silicon photonics is considered as one of the promising technologies for high-speed optical fiber communications. Among various silicon photonic devices, germanium on silicon avalanche photodiodes (Ge/Si APDs) have attracted tremendous attention due to their the properties of high performance and low cost. The sensitivity of 10Gb/s APD reached -29.5dBm at 1550 nm with the bit error rate of 1 × 10-12in 2015, and 25 Gb/s APD reached a highest sensitivity ever reported at about -23.5dBm at 1310 nm in 2016. Furthermore, a linear 28Gbaud APD receiver is found to have about 5dB more sensitivity than PIN solution for both multimode fiber (MMF) and single-mode fiber (SMF). Even with large defect density from lattice mismatch between Ge and Si substrate layer, Ge/Si APD devices demonstrate good reliability and pass all required qualification tests according to GR-468. In this paper, the structure, materials, process, performances, and reliability of APDs will be reviewed.
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