光伏系统
饱和电流
等效串联电阻
暗电流
二极管
电压
分流(医疗)
计算机科学
电气工程
电子工程
光电子学
材料科学
工程类
光电探测器
医学
心脏病学
作者
David L. King,B.R. Hansen,J.A. Kratochvil,Michael A. Quintana
标识
DOI:10.1109/pvsc.1997.654286
摘要
Dark current-voltage (dark I-V) measurements are commonly used to analyze the electrical characteristics of solar cells, providing an effective way to determine fundamental performance parameters without the need for a solar simulator. The dark I-V measurement procedure does not provide information regarding short-circuit current, but is more sensitive than light I-V measurements in determining the other parameters (series resistance, shunt resistance, diode factor and diode saturation currents) that dictate the electrical performance of a photovoltaic device. The work documented here extends the use of dark I-V measurements to photovoltaic modules, illustrates their use in diagnosing module performance losses and proposes their use for process monitoring during manufacturing.
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