A Method using T.E.M. and S.A.D. to Define the Structure of Anodized and Air Grown Oxide Films on Pure Titanium
作者
G. G. Shaw
出处
期刊:Proceedings ... annual meeting, Electron Microscopy Society of America [Cambridge University Press] 日期:1969-08-01卷期号:27: 124-125
标识
DOI:10.1017/s0424820100062531
摘要
We have determined the mechanical properties of aluminium oxide films by growing anodic films of known structure and thickness and relating these to natural oxide films. We are now investigating the mechanical properties of titanium oxide films, and to relate the stricture of anodic titania films to natural oxide films, we must, have more information than is contained in the literature.