材料科学
降级(电信)
钝化
纳米
千分尺
共发射极
应力消除
纳米尺度
复合材料
光电子学
纳米技术
光学
图层(电子)
电气工程
物理
工程类
作者
Kai Sporleder,Jan Bauer,Bengt Jäckel,Volker Nauman,Marko Turek,Christian Hagendorf
标识
DOI:10.1002/pssr.202100519
摘要
Detrimental corrosive potential‐induced degradation at the rear side of bifacial solar cells has been found recently. This potential‐induced degradation effect is nonreversible and shows typical surface damages in the micrometer scale. However, also areas in the cells showing no such surface damage suffer from electrical losses. Cracks in the nanometer scale underneath the surface, that is, at the interface between Si bulk and Al 2 O 3 , turn out to be the cause of this effect, leading to depassivation effects. The emergence of these cracks is assumed to originate from oxidation of the Si bulk due to potential‐induced degradation stress.
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