CMOS芯片
模拟电子学
电子线路
集成电路
电子工程
电气工程
模拟乘法器
材料科学
计算机科学
工程类
模拟信号
数字信号处理
出处
期刊:IEEE Transactions on Components, Hybrids, and Manufacturing Technology
[Institute of Electrical and Electronics Engineers]
日期:1986-09-01
卷期号:9 (3): 242-251
被引量:112
标识
DOI:10.1109/tchmt.1986.1136646
摘要
The design of CMOS analog integrated circuits to be operated at elevated junction temperatures is discussed. Considerations which have successfully been implemented in the design of basic analog cells for operation over the 25°-250°C range are emphasized. Simple models arc presented along with the temperature dependencies of key design parameters. These models and high-temperature trends represent sufficient information for first-order hand analysis prior to computeraided design.
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