材料科学
光电探测器
光电子学
电子迁移率
紫外线
氮化镓
暗电流
宽禁带半导体
无定形固体
光探测
带隙
光电二极管
纳米技术
图层(电子)
化学
有机化学
作者
Ningtao Liu,Tan Zhang,Li Chen,Jinfu Zhang,Shudong Hu,Wei Guo,Wenrui Zhang,Jichun Ye
标识
DOI:10.1109/led.2021.3132497
摘要
Gallium oxide (Ga2O3) is an emerging semiconductor for advanced optoelectronic applications owing to its suitable bandgap and advantageous electronic characteristics. While amorphous Ga2O3 is highly desired for low-cost and large-scale device application, it suffers from high dark current and slow response speed for practical ultraviolet photodetection. Here we integrate a polar aluminum nitride (AlN) template with amorphous Ga2O3 to fabricate a fast-response metal semiconductor metal (MSM) photodetector. It is revealed that the carrier transport and device performance strongly depend on the polarization direction of the AlN template. With a downward polarization from an Al-polar AlN layer, the Ga2O3 photodetector achieves an optimized performance with a lower dark current of 0.015 nA, a higher photo-to-dark current ratio of 104, a faster response speed of 31 ms and a recovery time of 22 ms. This study demonstrates an effective route of engineering carrier transport via the external spontaneous polarization for fabricating high-performance solar-blind photodetectors.
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