晶闸管
阻塞(统计)
MOS控制晶闸管
阻塞效应
静电感应晶闸管
集成门极换流晶闸管
电压
基础(拓扑)
门极关断晶闸管
电气工程
材料科学
碳化硅
图层(电子)
光电子学
复合材料
工程类
计算机科学
晶体管
数学
计算机网络
数学分析
发展心理学
心理学
栅氧化层
作者
M. E. Levinshteĭn,T. T. Mnatsakanov,S. N. Yurkov,A. G. Tandoev,Sei‐Hyung Ryu,John W. Palmour
出处
期刊:Semiconductors
[Pleiades Publishing]
日期:2016-03-01
卷期号:50 (3): 404-410
被引量:7
标识
DOI:10.1134/s1063782616030155
摘要
The possibility of creating a high-voltage SiC thyristor with an n-type blocking base is analyzed. It is shown that a thyristor structure fabricated as an "analog" of a modern thyristor structure with a p-type blocking base, i.e., with the same layer thicknesses and replaced doping types (donors instead of acceptors, and vice versa), cannot be turned-on at any input signal level. At room temperature, a structure with an n-type blocking base and acceptable parameters can only be obtained in the absence of a stop layer. In this case, however, the maximum blocking voltage is approximately two times lower than that for a thyristor with a p-type blocking base of the same thickness. In the presence of a stop layer, a portion of an S-shaped negative differential resistance appears at room temperature in the forward current–voltage characteristic of the thyristor with an n-type blocking base. This effect is due to the violation and subsequent restoration of neutrality. At ambient temperatures of T ≥ 150°C, the current–voltage characteristics of the thyristor with the n-type blocking base become quite acceptable even in the presence of a stop layer.
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