High-accuracy analyses of key minor and trace elements in zircon by electron probe microanalysis

A new EPMA method for determining minor and trace elements ( e.g. , Al, P, Ti, Y, Yb, Lu, Hf, Th, and U) in zircon was developed. It features low detection limits ( e.g. , Ti, 9 μg g −1 , 3 σ ), high spatial resolution (<3 μm), and high analytical accuracy.