结晶
材料科学
动力学
压痕硬度
相(物质)
差热分析
铋
矿物学
热力学
化学工程
微观结构
复合材料
化学
冶金
光学
有机化学
衍射
工程类
量子力学
物理
标识
DOI:10.1134/s1087659621020127
摘要
The comparative analysis of the kinetics of the bulk crystallization of AsSe1.5Bix glasses (х = 0, 0.01, and 0.05) in the temperature range 210–260°C is conducted by the data of density measurement using the generalized Kolmogorov–Avrami equation and the results of phase and differential thermal analysis. The kinetics of the surface crystallization of As2Se3 glass containing 0.4 at % Bi at 270 and 310°C and the parameters of the specific electrical conductivity and microhardness of the quenched semiconducting glass-ceramics at different stages of thermal treatment are studied.
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