铟
阴极发光
材料科学
光电子学
量子阱
电流密度
宽禁带半导体
量子效率
铟镓氮化物
场电子发射
电流(流体)
光致发光
红移
发光二极管
透射电子显微镜
量子
红灯
电子
发射光谱
氮化铟
自发辐射
蓝移
扫描电子显微镜
光发射
量子点
作者
Chunyu Liu,Panpan Li,Hira Usman,Anders Gustafsson,Yang Su,Zihan Xia,Weifang Lu,Xu Yang,Jinchai Li,Hongjian Li,Kai Huang,Zhaoxia Bi,Lars Samuelson,Rong Zhang
摘要
Achieving InGaN quantum wells (QWs) with high indium compositions for red emission presents significant challenges. One challenge is that the red peak is often accompanied by a short-wavelength emission with increased current injection. In this work, such dual-peak emissions in InGaN red multiple QWs (MQWs) were investigated using cross-sectional cathodoluminescence and scanning transmission electron microscopy. This was attributed to the compositional pulling effect. A peak shift from 570 to 600 nm, in conjunction with increased indium composition, was observed across the MQWs from the bottom to the top. By controlling the growth temperature of the individual QWs, short-wavelength emission was suppressed. As a result of this, InGaN red micro light-emitting-diodes (Micro-LEDs) were fabricated, showing a single red emission peak up to a current density of 100 A/cm2 (612 nm) and a peak external quantum efficiency of 7.9% at 5.2 A/cm2. This study not only reveals the presence of the CPE in red InGaN MQWs of high indium compositions but also demonstrates a remedy to achieve single-peak red emission even under high current density operation.
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