电阻随机存取存储器
材料科学
方向(向量空间)
Atom(片上系统)
超单元
路径(计算)
各向异性
蛋白质丝
分子物理学
凝聚态物理
电压
物理
几何学
光学
计算机科学
量子力学
气象学
程序设计语言
复合材料
嵌入式系统
雷雨
数学
作者
Yuehua Dai,Zhen Chen,Bo Jin,Ning Li,Xiaofeng Li
出处
期刊:Chinese Physics B
[IOP Publishing]
日期:2015-06-25
卷期号:24 (7): 073101-073101
被引量:8
标识
DOI:10.1088/1674-1056/24/7/073101
摘要
First-principles calculations are used to investigate the migration path of Ag in the HfO2-based resistive random access memory (ReRAM). The formation energy calculation suggests that there are two different sites (site 1 and site 3) for the incorporation of Ag atoms into the HfO2 unit cell. Thermodynamic analysis shows that the motion of Ag atom in the HfO2 supercell appears to be anisotropic, which is due to the fact that the Ag atom at site 3 moves along the orientation, but the Ag atom at site 1 moves along the [001] orientation. The migration barriers of the Ag atoms hopping between neighboring unit cells are calculated along five different orientations. Difficulty in producing motion of the Ag atom varies with the migration barrier: this motion is minimized along orientation. Furthermore, The optimal circulation path for Ag migration within the HfO2 supercells is obtained, and is found to be approximately along the orientation. Therefore, it is proposed that the positive voltage should be applied along this orientation, the conduction filament may form more easily, which could improve the response time and reduce the power consumption in ReRAM applications.
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