Importance of the Interface Condition upon Photoresist Image Adhesion in Microelectronic Device Fabrication
作者
John N. Helbert,Nabarun Saha
出处
期刊:Acs Symposium Series [American Chemical Society] 日期:1987-08-26卷期号:: 250-260被引量:1
标识
DOI:10.1021/bk-1987-0346.ch021
摘要
Microelectronic device fabrication currently relies primarily upon photoresist processing for integrated circuit pattern delineation. Adhesion of polymeric photoresist patterns, especially those of micron and submicron dimensions, to the required fabrication substrates is of paramount importance. Photoresist image adhesion problems encountered in device fabrication have been solved by chemical interfacial treatments. Current new trends in microelectronic adhesion technology will be described and discussed with emphasis upon the chemical nature of the interface involved as determined by ESCA.