缓冲器
电磁干扰
MOSFET
切换时间
材料科学
电磁干扰
振荡(细胞信号)
碳化硅
噪音(视频)
晶体管
电子工程
电气工程
光电子学
电容器
电压
工程类
计算机科学
人工智能
生物
冶金
图像(数学)
遗传学
作者
Yingzhe Wu,Shan Yin,Hui Li,Wenjie Ma
标识
DOI:10.1109/jestpe.2019.2953272
摘要
As the most popular wide bandgap (WBG) power device, the silicon carbide (SiC) metal-oxide-semiconductor field-effect transistor (MOSFET) has been widely adopted in the power electronics applications and brings in the benefits, including reduced switching losses, enhanced switching frequency, and improved power density. However, the switching oscillation and the electromagnetic interference (EMI) become more serious due to the rapid switching speed of SiC MOSFET. Thus, adding RC snubber branch is considered as an effective method to suppress such unwanted oscillation in the early works. In this article, the switching transient of SiC MOSFET with RC snubber is investigated with an analytical model based on the finite-state machine (FSM). The accuracy of the proposed analytical model can be verified by comparisons between the calculated and measured waveforms during the switching transition. In addition, the impacts of the RC snubber on switching oscillation, switching loss, and high-frequency (HF) EMI noise have been comprehensively investigated based on the model, which shows that the added RC snubber can effectively avoid the switching oscillation and reduce the level of HF EMI without increasing switching loss.
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