Field-assisted photoemission from InP/InGaAsP photocathode with p/n junction

A high quantum efficiency of photoemission to a 1.35 μm threshold has been achieved from an externally biased InP/InGaAsP photocathode which has a p/n junction instead of a Schottky contact. The quantum efficiency at 1.3 μm is 5% (electron per incident photon) with the photocathode cooled to −80 °C. The photocathode consists of a n+InP contact layer, a p−InP photoelectron-emitting layer and a p−InGaAsP photon-absorbing layer on a p+InP substrate.