P‐55: A High Accuracy Instrument for Measuring Both In‐Plane and Out‐Of‐Plane Birefringence in Birefringence Films

Abstract We report in this paper a new instrument, known as the Exicor ® birefringence measurement system, that measures both in‐plane and out‐of‐plane (vertical) birefringence in birefringence films. This instrument can be used as a quality control (QC) tool for birefringence film suppliers to test the accuracy and uniformity of their products. It can also be used as a research tool to study birefringence in birefringence films and their effects on LCD performance.