材料科学
纳米晶材料
硼
兴奋剂
硅
异质结
光电子学
纳米晶硅
太阳能电池
工程物理
纳米技术
晶体硅
化学
工程类
有机化学
非晶硅
作者
Amanda Merino,Patricia Martínez,María José Saavedra,Patricio Häberle,Tristan Gageot,José Alvarez,Jean‐Paul Kleider,Valeria del Campo,D. Muñoz
标识
DOI:10.1109/pvsc59419.2025.11132544
摘要
The best silicon heterojunction (SHJ) solar cells show the potential of nanocrystalline silicon (nc-Si:H) to improve their performance on both the emitter and BSF (back surface field) sides. However, in production, nc-Si:H presents several challenges, particularly in terms of deposition rate, reproducibility and stability of layers and interfaces. This work presents a comprehensive study using advanced characterization of the properties of (p) nc-Si:H films grown in an industrial scale equipment. We have focused on studying different thicknesses and the impact of annealing on our layers, although we need very thin nc-Si:H layers to avoid parasitic absorption and reduce deposition time. Above 40 nm nc-Si:H seems to crystallize and stabilize its properties, while below this thickness we deal with a transition phase with evolution in crystalline fraction and properties giving a more unstable material. On the other hand, blisters appeared on layers with thicknesses over 60 nm due to hydrogen accumulation and material stress. Understanding the material properties can serve not only for SHJ but also for TCO-free recombination junction in tandems using nc-Si:H layers.
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