材料科学
薄膜晶体管
光电子学
弯曲半径
氧化铟锡
弯曲
阈值电压
晶体管
电压
柔性电子器件
灵活的显示器
灵活性(工程)
氧化物
半径
电子工程
过程(计算)
复合材料
铟
电子迁移率
降级(电信)
溶解过程
活动层
逻辑门
作者
Zuoxu Yu,Yuzhen Zhang,Tingrui Huang,Wenting Xu,Mingming Liu,Di Gui,Kelin Sui,Guangan Yang,Wei Sun,Runxiao Shi,Wangran Wu
标识
DOI:10.1088/1674-4926/25060021
摘要
Abstract The increasing pursuit of ultra-high resolution displays has driven the demand for thin film transistors (TFTs) with higher mobility, especially on flexible substrates. In this work, we developed indium tin oxide (ITO) TFTs on flexible substrates for the first time and achieved a remarkable average mobility of 39.1 cm 2 ·V −1 ·s −1 , via mass-production compatible processes utilizing SiO 2 gate dielectric. Benefiting from the ultra-flat surface and extremely low coefficient of thermal expansion (CTE) of our PI substrate, the ITO TFTs exhibit excellent large-scale uniformity. Additionally, the TFTs generate minor variations of −5.5% and +0.45 V in mobility and threshold voltage under a bending radius of 7 mm, respectively. They stay fully functional even after a dynamic bending test up to 13 000 cycles, observing no obvious degradation in mobility and threshold voltage. The reliable mechanical flexibility and robust bending durability demonstrate their great potential for ultra-high resolution flexible displays in the future.
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