钝化
材料科学
激发态
光电子学
电子
量子点
超快激光光谱学
二极管
吸收(声学)
载流子
纳米颗粒
吸收光谱法
光谱学
分子物理学
化学物理
深能级瞬态光谱
载流子寿命
量子阱
表面电荷
加速老化
纳米技术
电荷(物理)
量子
原子物理学
作者
Zhijie Yan,Bo Li,Wenjing Zhang,Yaqi Guo,Leilei Zhao,Qing Xue,Yu Yan,Xingzhi Wang,Huaiyu Xu,Xiaosuo WANG,Huaibin Shen,Fengjia Fan
出处
期刊:Nano Letters
[American Chemical Society]
日期:2026-10-12
卷期号:26 (41): 14310-14317
标识
DOI:10.1021/acs.nanolett.6c03813
摘要
Quantum dot light-emitting diodes (QD-LEDs) require encapsulation to extend their storage and operational lifetime. However, acidic encapsulants commonly used usually induce an anomalous positive aging phenomenon─the device performance improves rather than decreases in the initial days. These uncontrollable gains hinder the commercialization of QD-LEDs, yet no study to date has directly probed the in situ evolution of charge carriers during this process. Here, we employ electrically excited transient absorption (EETA) spectroscopy to investigate how encapsulants influence charge carrier dynamics in QD-LEDs. Taking red QD-LEDs as a model system, we demonstrate that positive aging is accompanied by enhanced electron charging in the quantum dot (QD) layer and accelerated electron injection into the emissive layer. Furthermore, we show that acid-induced progressive passivation of surface defects on ZnMgO nanoparticles improves electron injection efficiency. This work reveals that enhanced electron charging induces positive aging in QD-LEDs.
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