Structural Reliability Analysis of Large Planar Steam Solid Oxide Electrolysis Cells

Solid oxide electrolysis cells (SOEC) have been receiving significant attention recently because of their high energy efficiency and fast hydrogen production. In our previous study, a multi-physics modeling framework to simulate the SOEC performance and structural reliability of planar SOEC design was developed and demonstrated. The electrochemical reactions, fluid dynamics, species transport, electron transfer, and heat transfer were modeled in the commercial computational fluid dynamics (CFD) software STAR-CCM+. The thermomechanical analysis and the associated structural reliability evaluations were conducted using the commercial finite element analysis software ANSYS. The electrochemistry model was validated by using the experimentally obtained current-voltage (I-V) characteristics of the electrode-supported SOECs. In this study, this framework was applied on a large 300 cm 2 steam planar SOEC design, and systematically studied the structural reliability under combinations of cell operating conditions, with cell voltage 1-1.5 V, steam fraction in fuel inlet 0.7-0.9, air inlet flow rate 0-10 L/min, fuel inlet flow rate 2.5-12.5 L/min, and inlet temperature 600-900 C. In the modeling framework, all the cells were investigated under the adiabatic thermal conditions, which is equivalent to packing the cell in an insulated container. This induced the relatively larger temperature variation than in the smaller cell designs. This cell internal temperature non-uniformity may further enhance the spatial variations of open circuit voltage, activation loss, and ionic conductivity in the cell, which all influence the overall cell performance. This situation is more obvious when the cell voltage is higher than 1.35V, under which the cell is significantly heated along the steam flow direction. Traditionally, it is assumed that the cell internal temperature spatial variation plays an important role on cell structural reliability. However, because it was assumed that all the components in cell are stress free at 850 , the cell temperature deviation from 850 is more critical to the stress distribution and structural reliability in the cell. For the investigated cells in the practical conditions, like 750 C inlet temperature and varying voltage from 1.05 to 1.5 V, the highest first principal stress is always in the air side electrode, which is around 45 MPa. This is explained by the higher coefficient of thermal expansion of LSCF-GDC with respect to the other layers. This may indicate that the failure would possibly occur in the air side electrode, but at low risk due to the relatively higher Weibull characteristic strength.