二硫化钼
钝化
石墨烯
外延
材料科学
晶体管
钼
光电子学
二硫键
纳米技术
化学
冶金
图层(电子)
电气工程
生物化学
工程类
电压
作者
Po‐Cheng Tsai,Chun‐Wei Huang,Shoou-Jinn Chang,Shu‐Wei Chang,Shih‐Yen Lin
标识
DOI:10.1038/s41598-023-36405-9
摘要
Abstract We demonstrate in-plane gate transistors based on the molybdenum disulfide (MoS 2 )/graphene hetero-structure. The graphene works as channels while MoS 2 functions as passivation layers. The weak hysteresis of the device suggests that the MoS 2 layer can effectively passivate the graphene channel. The characteristics of devices with and without removal of MoS 2 between electrodes and graphene are also compared. The device with direct electrode/graphene contact shows a reduced contact resistance, increased drain current, and enhanced field-effect mobility. The higher field-effect mobility than that obtained through Hall measurement indicates that more carriers are present in the channel, rendering it more conductive.
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